• DocumentCode
    1582919
  • Title

    Testing and diagnostics of SIMD arrays

  • Author

    Sosnowski, J.

  • Author_Institution
    Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland
  • fYear
    1997
  • Firstpage
    96
  • Lastpage
    103
  • Abstract
    An original approach to the testing and diagnostics of SIMD (single instruction, multiple data) systems is presented. Test algorithms for typical data processing elements of SIMDs are described and the problem of their optimal software implementation in the SIMD environment is discussed (concurrent testing, error coverage and time overhead). Fault localization procedures (diagnostics) are combined with testing processes.
  • Keywords
    computer testing; fault location; systolic arrays; SIMD array diagnostics; SIMD array testing; concurrent testing; data processing elements; error coverage; fault localization procedures; optimal software implementation; time overhead; Circuit faults; Circuit testing; Controllability; Data processing; Observability; Performance evaluation; Read-write memory; Registers; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EUROMICRO 97. New Frontiers of Information Technology., Proceedings of the 23rd EUROMICRO Conference
  • Conference_Location
    Budapest, Hungary
  • ISSN
    1089-6503
  • Print_ISBN
    0-8186-8129-2
  • Type

    conf

  • DOI
    10.1109/EURMIC.1997.617226
  • Filename
    617226
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1582919