Title :
A novel fully differential pixel concept for indirect TOF 3D measurement
Author :
Stoppa, David ; Gonzo, Lorenzo ; Gottardi, Massimo ; Simoni, Andrea ; Viarani, Luigi
Author_Institution :
ITC-IRST
Keywords :
CMOS technology; Circuits; Costs; Electronic equipment testing; Layout; Logic testing; Optical imaging; Pulse measurements; Real time systems; Velocity measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208139
