• DocumentCode
    1583662
  • Title

    Deterministic bist in partial scan environment

  • Author

    Greene, Brian ; Kay, Dennis ; Mourad, S.

  • Author_Institution
    Santa Clara University
  • Volume
    1
  • fYear
    2003
  • Firstpage
    303
  • Lastpage
    308
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Logic testing; Sequential analysis; Sequential circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208171
  • Filename
    1208171
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1583662