Title :
Environmental based characterization of soc for stratified testing
Author :
Park, N.J. ; George, K.M. ; Park, N. ; Choi, M. ; Kim, Y.B. ; Lombardi, F.
Author_Institution :
Oklahoma State University
Keywords :
Application specific integrated circuits; Assembly; Computer science; Fabrication; Integrated circuit testing; Integrated circuit yield; Manufacturing; Statistical analysis; System testing; Yield estimation;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208175
