• DocumentCode
    1583792
  • Title

    Environmental based characterization of soc for stratified testing

  • Author

    Park, N.J. ; George, K.M. ; Park, N. ; Choi, M. ; Kim, Y.B. ; Lombardi, F.

  • Author_Institution
    Oklahoma State University
  • Volume
    1
  • fYear
    2003
  • Firstpage
    327
  • Lastpage
    332
  • Keywords
    Application specific integrated circuits; Assembly; Computer science; Fabrication; Integrated circuit testing; Integrated circuit yield; Manufacturing; Statistical analysis; System testing; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7705-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2003.1208175
  • Filename
    1208175
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1583792