DocumentCode :
1584009
Title :
Finite Element Analysis Procedure for Board-level Swept Sine Vibration Tests
Author :
Yeh, Chang-Lin ; Lai, Yi-Shao ; Wang, Ching-Chun
Author_Institution :
Lab. of Stress-Reliability, Adv. Semicond. Eng., Inc., Kaohsiung
fYear :
2006
Firstpage :
1
Lastpage :
4
Abstract :
We derive in this paper equations of motion of board-level electronic packages subjected to swept sine vibration loads following the support excitation scheme. Harmonic analysis is performed based on the argument such that at each loading state over the swept sine process, hysteresis responses of solder joints following the isotropic hardening rule vanish fairly quickly so that plasticity is fully developed. Computed and measured acceleration response spectra of a board-level test vehicle are benchmarked
Keywords :
electronics packaging; finite element analysis; harmonic analysis; mechanical testing; solders; vibrations; acceleration response spectra; board-level electronic packages; board-level swept sine vibration tests; finite element analysis procedure; harmonic analysis; hysteresis responses; isotropic hardening rule; solder joints; Accelerometers; Electronics packaging; Equations; Finite element methods; Harmonic analysis; Hysteresis; Life estimation; Soldering; Testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly Conference Taiwan, 2006. IMPACT 2006. International
Conference_Location :
Taipei
Print_ISBN :
1-4244-0735-4
Electronic_ISBN :
1-4244-0735-4
Type :
conf
DOI :
10.1109/IMPACT.2006.312203
Filename :
4107460
Link To Document :
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