Title :
A new linearity measurement algorithm for sub-micron microwave cmos
Author :
Choi, Woo Young ; Choi, Byung Yong ; Woo, Dong-Soo ; Lee, Jong Duk ; Park, Byung-Gook
Author_Institution :
Seoul National University
Keywords :
Capacitance measurement; Character generation; Data mining; Electric variables measurement; Linearity; Loss measurement; Microwave devices; Microwave measurements; Noise measurement; Semiconductor device noise;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208183
