• DocumentCode
    1584185
  • Title

    Test bench for active ageing of power modules reproducing constraints close to automotive driving conditions

  • Author

    Bachti, S. ; Dupont, Laurent ; Loudot, S. ; Coquery, G.

  • Author_Institution
    New Technol. Lab. (IFSTTAR LTN), French Inst. of Sci. & Technol. for Transp. Dev. & Networks, Versailles, France
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Power modules designed for hybrid/electric traction should fulfil lean manufacturing considerations. Robustness study of IGBT modules on the basis of a representative driving cycle is mandatory for safety reasons, cost and lifetime estimation. So power modules can not be oversized and harsh stresses applied conduct to review ageing tests. The power modules for motor drives are subject to multiple failure modes which are due to many damaging factors. Generally we perform the damage evaluation of power modules by thermal and active accelerated power cycling tests. In order to take into account of new automotive domain requirements, this paper proposes a tester applying low voltage electrothermal stresses on power module close to the automotive urban driving conditions.
  • Keywords
    ageing; automotive electronics; insulated gate bipolar transistors; life testing; modules; power bipolar transistors; road safety; thermal stresses; IGBT modules; active accelerated power cycling tests; active ageing; ageing tests; automotive driving conditions; automotive urban driving conditions; cost estimation; damage evaluation; hybrid-electric traction; lean manufacturing; lifetime estimation; low voltage electrothermal stresses; motor drives; multiple failure modes; power modules; representative driving cycle; safety; test bench; thermal power cycling tests; Aging; Current density; Insulated gate bipolar transistors; Junctions; Multichip modules; Stress; Temperature measurement; Ageing; Automotive component; Power cycling; Robustness; Test bench;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE), 2013 15th European Conference on
  • Conference_Location
    Lille
  • Type

    conf

  • DOI
    10.1109/EPE.2013.6634415
  • Filename
    6634415