• DocumentCode
    1584295
  • Title

    The effect of environmental factors on degradation and recovery characteristics of RTV silicone rubber

  • Author

    Huh, Chang-Su ; Youn, Bok-Hee

  • Author_Institution
    Dept. of Electr. Eng., Inha Univ., Inchon, South Korea
  • Volume
    4
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    172
  • Abstract
    Room temperature vulcanized (RTV) silicone rubber has been widely used to coat porcelain insulators to render water repellency to prevent formation of water filming on the surface and thus to suppress the leakage current and consequently flashover. However, the electrical property and its hydrophobicity of RTV silicone rubber coating under outdoor conditions may be influenced by many environmental factors. In this study various treatments, such as salt-fog, salt water immersion and UV irradiation were applied to the samples to investigate the change of the electrical property and hydrophobicity. As a result the leakage current increased and contact angle decreased as the degradation time is longer. But the degraded RTV silicone rubber has recovered its hydrophobicity during drying time in ambient condition because LMW (low molecular weight) silicone fluid diffused from the bulk to the surface
  • Keywords
    porcelain insulators; RTV silicone rubber; UV irradiation test; contact angle decrease; degradation characteristics; degraded RTV silicone rubber; drying time; electrical property; environmental factors; environmental factors effect; flashover suppression; hydrophobicity; leakage current increase; leakage current suppression; low molecular weight silicone fluid; outdoor conditions; porcelain insulators coating; recovery characteristics; room temperature vulcanized silicone rubber; salt water immersion test; salt-fog test; water filming prevention; water repellency;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467)
  • Conference_Location
    London
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-719-5
  • Type

    conf

  • DOI
    10.1049/cp:19990820
  • Filename
    821248