DocumentCode

1584312

Title

The study of buffer structure of On-board test´s circuit module in high shock

Author

Peng, Xu ; Jing, Zu ; Zu-Seng, Lin

Author_Institution

North China Institute of Technology

Volume

1

fYear

2003

Firstpage

431

Lastpage

434

Keywords

Circuit testing; Electric shock;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE

ISSN

1091-5281

Print_ISBN

0-7803-7705-2

Type

conf

DOI

10.1109/IMTC.2003.1208195

Filename

1208195