Title :
The study of buffer structure of On-board test´s circuit module in high shock
Author :
Peng, Xu ; Jing, Zu ; Zu-Seng, Lin
Author_Institution :
North China Institute of Technology
Keywords :
Circuit testing; Electric shock;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208195
