• DocumentCode
    1584451
  • Title

    Non-destructive complex permittivity measurements of absorbing materials

  • Author

    Villemazet, J.F. ; Chatard-Moulin, M. ; Guillon, P. ; Jallageas, H.

  • Author_Institution
    IRCOM, Limoges Univ., France
  • fYear
    1991
  • Firstpage
    232
  • Lastpage
    235
  • Abstract
    A flanged circular waveguide propagating dominant TE11 mode is used to test absorbing properties of a plate-shaped dielectric sample placed at the opened waveguide end. In this method, which is a non-destructive local one, the material complex permittivity ε\´-ε" is evaluated from vectorial reflection coefficient measurement. Associated to a test set up, compatible software which numerically computes vectorial reflection coefficients Γ and automatically constructs ε\´ and ε" charts as a function of Γ has been developed. The influence of different measurement parameters on chart characteristics has been shown to yield the permittivity in optimal conditions and to make this method fast, easy to use, and as accurate as possible. Many absorbing materials have been tested using this non-destructive technique. The results are in good agreement with those obtained using the well-known loaded rectangular waveguide method
  • Keywords
    electronic engineering computing; nondestructive testing; permittivity measurement; absorbing materials; absorbing properties; chart characteristics; complex permittivity measurements; dominant TE11 mode; flanged circular waveguide; nondestructive measurement; opened waveguide end; plate-shaped dielectric sample; software; vectorial reflection coefficient measurement; vectorial reflection coefficients; Automatic testing; Dielectric materials; Dielectric measurements; Loaded waveguides; Materials testing; Nondestructive testing; Permittivity measurement; Reflection; Software testing; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-87942-579-2
  • Type

    conf

  • DOI
    10.1109/IMTC.1991.161582
  • Filename
    161582