DocumentCode
1584740
Title
Low-cost deflection measurement for rapid characterization of microelectromechanical systems (mems)
Author
Firebaugh, Samara L. ; Charles, Harry K., Jr. ; Edwards, Richard L. ; Keeney, Allen C. ; Wilderson, Samuel F.
Author_Institution
United States Naval Academy
Volume
1
fYear
2003
Firstpage
499
Lastpage
502
Keywords
Calibration; Displacement measurement; Microelectromechanical systems; Micromechanical devices; Optical fiber sensors; Optical fibers; Optical sensors; Sensor systems; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1208208
Filename
1208208
Link To Document