DocumentCode

1585066

Title

Design challenges for the 45 nm node and below

Author

Schoellkopf, Jean-Pierre

Author_Institution

STMicroelectronics

fYear

2006

fLanguage

English

Publisher

ieee

Conference_Titel

Very Large Scale Integration, 2006 IFIP International Conference on

Conference_Location

Nice, France

Print_ISBN

3-901882-19-7

Type

conf

DOI

10.1109/VLSISOC.2006.313274

Filename

4107592