• DocumentCode
    1585087
  • Title

    Introduction to panel discussion Probabilistic & statistical design - the wave of the future

  • Author

    Borkar, Shekhar

  • Author_Institution
    Intel Corporation
  • fYear
    2006
  • Keywords
    Error analysis; Fluctuations; Integrated circuit reliability; Lithography; Power grids; Power system dynamics; Power system reliability; Stress; System performance; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Very Large Scale Integration, 2006 IFIP International Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    3-901882-19-7
  • Type

    conf

  • DOI
    10.1109/VLSISOC.2006.313283
  • Filename
    4107593
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1585087