Title :
The power-dependent test of high temperature superconductor CPW transmission line
Author :
Xiongfei, Zou ; Shirong, Bu ; Zhengxiang, Luo ; Junsong, Ning ; Cheng, Zeng
Author_Institution :
Sch. of Optoelectron. Inf., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
This paper presents a fabricated coplanar waveguide transmission line based on high-temperature superconductor thin-films (HTS), whose power-dependent performance is also tested here. We find that if the input is switched from low power to high power, i.e., the microwave current in the CPW line exceeds critical value, the transmission line transits from low-loss superconducting state to high-loss normal state at 77 K in liquid nitrogen, The power-dependent measurement is made in 2-5 GHz using 200 MHz frequency interval, and the critical power at each frequency is between 27-28 dBm. the surface impedance varies steeply from low level to high when transferred power reaches the critical value. This device is hopeful to be a microwave power limiter and the test result is useful for the development of the microwave power limiter.
Keywords :
coplanar transmission lines; coplanar waveguides; high-temperature superconductors; microwave limiters; superconducting device testing; superconducting microwave devices; superconducting thin films; surface impedance; CPW line; HTS; critical power; critical value; fabricated coplanar waveguide transmission line; frequency 2 GHz to 5 GHz; frequency interval; high temperature superconductor CPW transmission line; high-loss normal state; high-temperature superconductor thin-films; liquid nitrogen; low-loss superconducting state; microwave current; microwave power limiter; power-dependent measurement; power-dependent performance; power-dependent test; surface impedance; Coplanar waveguides; High temperature superconductors; Microwave FET integrated circuits; Microwave integrated circuits; Superconducting microwave devices; Superconducting transmission lines; Transmission line measurements; critical power; power-dependent test; superconducting nonlinearity; superconductor microwave limiter; surface impedance;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037710