• DocumentCode
    1585130
  • Title

    Probabilistic CMOS Technology: A Survey and Future Directions

  • Author

    Akgul, Bilge E S ; Chakrapani, Lakshmi N. ; Korkmaz, Pinar ; Palem, Krishna V.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Highly scaled CMOS devices in the nanoscale regime would inevitably exhibit statistical or probabilistic behavior. Such behavior is due to process variations and other perturbations such as noise. Therefore current circuit design methodologies, which depend on the existence of deterministic and uniform devices with no consideration for either power consumption or probabilistic behavior, would no longer be sufficient to design robust circuits. To help overcome this challenge, CMOS devices have been characterized with probabilistic behavior (probabilistic CMOS or PCMOS devices) at several levels: from foundational principles to analytical modeling, simulation, fabrication and measurement, as well as innovative approaches to harnessing PCMOS devices in system-on-a-chip architectures which can implement a wide range of applications. This paper presents a broad overview of our contributions in the domain of PCMOS, and outline ongoing work and future challenges in this area
  • Keywords
    CMOS integrated circuits; integrated circuit modelling; nanoelectronics; statistical analysis; system-on-chip; CMOS devices; PCMOS devices; nanoscale regime; probabilistic CMOS technology; probabilistic behavior; process variations; robust circuits design; statistical behavior; Analytical models; CMOS technology; Circuit noise; Circuit simulation; Circuit synthesis; Energy consumption; Nanoscale devices; Noise robustness; Power system modeling; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Very Large Scale Integration, 2006 IFIP International Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    3-901882-19-7
  • Type

    conf

  • DOI
    10.1109/VLSISOC.2006.313282
  • Filename
    4107595