Title :
Skin-type resistance and measurement of heavy-current circuit parameters
Author_Institution :
Inst. of Problems of Electrophys., Acad. of Sci., St. Petersburg, Russia
Abstract :
The phenomenon of diffusion in the massive conductors of the pulsed electro-magnetic field with small skin depth is studied. The approximate decision of the diffusion problem was found by the perturbation method and used for deduction of the relationship between current and voltage drop on the massive conductors. This relationship depends on the time-constant parameters: the external inductance of conductors L and the characterizing field diffusion in metal parameter S. which was named "skin-type resistance". The typical features of the voltage drop on the massive conductors are described and shown in the oscillograms. The methods of L and S measurement by the current and voltage oscillograms processing are presented.
Keywords :
conductors (electric); electric current measurement; electromagnetic fields; oscillographs; pulse generators; pulsed power supplies; skin effect; voltage measurement; current oscillograms; diffusion phenomenon; external inductance; field diffusion; heavy-current circuit parameters measurement; massive conductors; perturbation method; pulsed electro-magnetic field; pulsed power supplies; skin-type resistance; time-constant parameters; voltage oscillograms; Boundary conditions; Circuits; Conductors; Electrical resistance measurement; Electromagnetic fields; Impedance; Inductance; Perturbation methods; Skin effect; Voltage;
Conference_Titel :
Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7120-8
DOI :
10.1109/PPPS.2001.1001843