Title :
Scanner parameter estimation using bilevel scans of star charts
Author :
Smith, Elisa H Barney
Author_Institution :
Electr. & Comput. Eng. Dept., Boise State Univ., ID, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
Scanning a high-contrast image in bilevel mode results in image degradation. This is caused by two primary effects: blurring and thresholding. This paper expands on a method of estimating a joint distortion parameter called the edge spread, from a star sector test chart in order to calculate the values of the point spread function width and binarization threshold. This theory is also described for variations in the source pattern which can represent degradations caused by repetition of the bilevel process as would be seen in printing then scanning, or in repeated photocopying. Estimation results are shown for the basic and extended cases
Keywords :
astronomy computing; document image processing; finding charts; image scanners; parameter estimation; photocopying; printing; bilevel process repetition; bilevel scans; binarization threshold; blurring; edge spread; high-contrast image; image degradation; joint distortion parameter; point spread function width; printing; repeated photocopying; scanner parameter estimation; source pattern variations; star charts; star sector test chart; thresholding; Accuracy; Area measurement; Degradation; Image converters; Noise reduction; Optical character recognition software; Parameter estimation; Printing; Size measurement; Testing;
Conference_Titel :
Document Analysis and Recognition, 2001. Proceedings. Sixth International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7695-1263-1
DOI :
10.1109/ICDAR.2001.953968
