Title :
Revisiting response compaction in space for full scan circuits with nonexhaustive test sets using concept of sequence characterization
Author :
Das, Sunil R. ; Assaf, Mansour H. ; Petriu, Emil M. ; Jone, Wen B.
Author_Institution :
University of Ottawa
Keywords :
Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Compaction; Costs; Design engineering; Hardware; Manufacturing; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208246
