DocumentCode :
1585704
Title :
Lifetime and reliability data of commercial excimer laser power systems modules
Author :
Melcher, P. ; Johns, D. ; Ness, R. ; Partlo, B.
Author_Institution :
CYMER Inc., San Diego, CA, USA
Volume :
2
fYear :
2001
Firstpage :
1539
Abstract :
Since 1996, CYMER has manufactured over 1500 excimer lasers for the application of integrated circuit photolithography. Because reliability and cost of operation (CoO) are critical in the semiconductor industry, it is extremely important to quantify these parameters for the laser and each of the primary modules. Lifetime and reliability data for the initial generation of solid state pulsed power module (SSPPM) units are presented from a number of sources, including more than 750 laser systems in the field in addition to a number of in-house module verification systems. Highly accelerated life test (HALT) experiments have also been implemented at CYMER to help quantify the design margins of these modules with respect to operating parameters such as temperature and voltage. In addition, results are updated from an experiment involving testing of a SSPPM to over 50B shots where the unit was characterized at several intervals in an attempt to detect any potential signs of degradation which might limit the operational lifetime or cause the unit to fail. To date, no such indications of degradation have been measured. The paper compares actual reliability and lifetime data from these various sources compared to the original lifetime estimates.
Keywords :
excimer lasers; life testing; pulsed power supplies; reliability; CYMER; commercial excimer laser; cost of operation; excimer laser power systems modules; highly accelerated life test; in-house module verification systems; integrated circuit photolithography; lifetime data; reliability data; solid state pulsed power module; Degradation; Industrial power systems; Integrated circuit manufacture; Integrated circuit reliability; Life estimation; Life testing; Optical pulse generation; Power lasers; Power system reliability; Semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7120-8
Type :
conf
DOI :
10.1109/PPPS.2001.1001854
Filename :
1001854
Link To Document :
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