Title :
Variation-Aware, Library Compatible Delay Modeling Strategy
Author :
Silva, Luis Guerra e ; Zhu, Zhenhai ; Phillips, Joel R. ; Miguel Silveira, L.
Author_Institution :
Dept. of Informatics, Tech. Univ. Lisbon, Lisboa
Abstract :
Variability in digital integrated circuits makes timing verification an increasingly challenging task. Statistical static timing analysis has been proposed as a solution to this problem, but most of the work has concentrated in the development of timing engines for computing delay propagation. Such tools rely on the availability of delay formulas accounting for both cell and interconnect delay. In this paper, we concentrate on the impact of interconnect on delay and propose an extension to the standard modeling strategies that is variation-aware and compatible with such statistical engines. Our approach, based on a specific type of perturbation analysis, allows for the analytical computation of the quantities needed for statistical delay propagation. We also show how perturbation analysis can be performed when only the standard delay table lookup models are available for the standard cells. Results from applying our proposed modeling strategy to computing delays and slews in several instances accurately match similar results obtained using electrical level simulation
Keywords :
digital integrated circuits; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; logic design; statistical analysis; delay modeling strategy; delay propagation computing; digital integrated circuits; electrical level simulation; interconnect delay; perturbation analysis; statistical delay; statistical engines; statistical static timing analysis; table lookup models; timing engines; timing verification; Closed-form solution; Delay estimation; Engines; Integrated circuit interconnections; Laboratories; Libraries; Performance analysis; Propagation delay; Table lookup; Timing;
Conference_Titel :
Very Large Scale Integration, 2006 IFIP International Conference on
Conference_Location :
Nice
Print_ISBN :
3-901882-19-7
DOI :
10.1109/VLSISOC.2006.313215