DocumentCode :
1585847
Title :
High voltage testing of capacitors
Author :
Shkuratov, S.I. ; Talantsev, E.F. ; Kristiansen, M. ; Dickens, J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA
Volume :
2
fYear :
2001
Firstpage :
1559
Abstract :
Three different types of capacitor have been tested to determine maximum usable high voltage. The capacitor testing was performed in the dynamic mode. The voltage rise varied from 200 to 400 V/sec. Disc ceramic and thin film capacitors of different value and different nominal voltages were tested. Experiments have shown that the breakdown voltage for all types of the capacitors tested is about ten times more than the nominal voltage of the capacitors. Data are given for the limiting high voltage for each kind of capacitor. Experiments have shown that the mechanisms for the destruction of each type of capacitor have specific features.
Keywords :
ceramic capacitors; electric breakdown; high-voltage techniques; pulsed power technology; testing; thin film capacitors; breakdown voltage; capacitor destruction mechanisms; capacitor testing; compact pulsed power systems; disc ceramic film capacitors; high voltage testing; limiting high voltage; thin film capacitors; voltage rise; Capacitors; Ceramics; Circuit testing; Electronic components; Performance evaluation; Probes; Pulse power systems; Resistors; System testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7120-8
Type :
conf
DOI :
10.1109/PPPS.2001.1001859
Filename :
1001859
Link To Document :
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