DocumentCode :
1586077
Title :
High-temperature storage and thermal shock studies of passive component attach materials
Author :
Naefe, Jeffrey E. ; Johnson, R. Wayne ; Grzyvowski, R.R.
Author_Institution :
Dept. of Electr. Eng., Auburn Univ., AL, USA
fYear :
1998
Firstpage :
68
Lastpage :
78
Abstract :
In this work, the high temperature testing of passive component attach materials is reported. The target operating temperature for this research was 200°C to 225°C. The four materials chosen for the study were Ablestik (71-1) silver filled polyimide, EPO-TEK (E3081) silver-filled epoxy, Grace Specialty Polymers (CS6000) silver filled silicone, and Indalloy´s (IND. 183) 88Au/12Ge eutectic solder. The two board materials selected for study were 96% alumina ceramic substrates and high temperature cyanate ester circuit boards. Resistors and capacitors were selected as the passive components. Since eutectic Sn/Pb solder terminations were unusable at these temperatures, end terminations for both the resistors and capacitors were Pd/Ag and Au. The test pattern was of a series resistor chain of eight 0-ohm resistors (120 mil×60 mil) and three independent 12 μF ceramic multilayer capacitors (750 mil×650 mil). The storage temperatures selected were 175°C, 250°C, and 300°C. The cyanate ester boards were tested in the 175°C and 250°C ambients, while the ceramic substrates were tested in the 250°C and 300°C environments. The polymer based component attach materials were tested at 175°C and 250°C, while the Au/Ge solder was tested at 300°C. Thermal shock studies have been performed through 910 liquid to liquid cycles with a temperature range from -55°C to 200°C. Both Pd/Ag and Au terminated components on cyanate ester circuit boards and some ceramic substrates were included in these thermal shock rests
Keywords :
filled polymers; high-temperature electronics; packaging; printed circuit testing; soldering; thermal shock; 175 to 300 degC; Ablestik 71-1; EPO-TEK E3081; Grace Specialty Polymers CS6000; Indalloy IND. 183; ceramic multilayer capacitors; ceramic substrates; cyanate ester circuit boards; end terminations; eutectic solder; filled epoxy; filled polyimide; filled silicone; high temperature testing; high-temperature storage; liquid to liquid cycles; passive component attach materials; series resistor chain; storage temperatures; thermal shock studies; Capacitors; Ceramics; Circuit testing; Electric shock; Gold; Materials testing; Polymers; Resistors; Silver; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Temperature Electronics Conference, 1998. HITEC. 1998 Fourth International
Conference_Location :
Albuquerque, NM
Print_ISBN :
0-7803-4540-1
Type :
conf
DOI :
10.1109/HITEC.1998.676763
Filename :
676763
Link To Document :
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