• DocumentCode
    1586406
  • Title

    Development of open architecture test systems

  • Author

    Diyin, Tang ; Jinsong Yu ; Xiongzi, Chen ; Honglun, Wang

  • Author_Institution
    Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
  • Volume
    2
  • fYear
    2011
  • Firstpage
    51
  • Lastpage
    54
  • Abstract
    Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.
  • Keywords
    automatic test equipment; design for testability; ATE software technologies; next generation test system; open architecture test systems; parallel development; test software; Computer architecture; Educational institutions; Hardware; Instruments; Libraries; Software; Testing; ATE; ATE software technologies; application-oriented; open architecture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8158-3
  • Type

    conf

  • DOI
    10.1109/ICEMI.2011.6037763
  • Filename
    6037763