DocumentCode
1586406
Title
Development of open architecture test systems
Author
Diyin, Tang ; Jinsong Yu ; Xiongzi, Chen ; Honglun, Wang
Author_Institution
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
Volume
2
fYear
2011
Firstpage
51
Lastpage
54
Abstract
Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.
Keywords
automatic test equipment; design for testability; ATE software technologies; next generation test system; open architecture test systems; parallel development; test software; Computer architecture; Educational institutions; Hardware; Instruments; Libraries; Software; Testing; ATE; ATE software technologies; application-oriented; open architecture;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8158-3
Type
conf
DOI
10.1109/ICEMI.2011.6037763
Filename
6037763
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