DocumentCode
1586437
Title
The Performance Study of Two Genetic Algorithm Approaches for VLSI Macro-Cell Layout Area Optimization
Author
Rahim, H.A. ; Rahman, A.A.A. ; Ahmad, R.B. ; Ariffin, W. N F W ; Ahmad, M.I.
Author_Institution
Sch. of Comput. & Commun. Eng., Univ. Malaysia Perils, Kuala Perlis
fYear
2008
Firstpage
207
Lastpage
212
Abstract
Very large scale integrated (VLSI) design has been the subject of much research since the early 1980s where the VLSI cell placement emerges to be a crucial stage in the chip design. Its area optimization is very important in order to reduce the delay and include more functionalities to the designed chip. The VLSI cell area optimization continues to become increasingly important to the performance of VLSI design due to the accelerating of the design complexities in VLSI. Thus, this paper addresses the performance comparisons of two different types of genetic algorithm (GA) techniques for VLSI macro-cell layout area optimization by utilizing the adopted method of cell placement that is binary tree method. Two GA approaches which are simple genetic algorithm (SGA) and steady-state genetic algorithm (SSGA) have been implemented and their performances in converging to their global minimums are examined and discussed. The performances of these techniques are tested on Microelectronics Center of North Carolina (MCNC) benchmark circuit´s data set. The experimental results demonstrate that both algorithms achieve acceptable area requirement compared to the slicing floorplan approach (Lin et al., 2002). However, SSGA outperforms SGA where it achieves faster convergence rate and obtains more near optimum area.
Keywords
VLSI; circuit optimisation; convergence; genetic algorithms; integrated circuit layout; logic design; microprocessor chips; trees (mathematics); VLSI macrocell layout area optimization; binary tree method; chip design; convergence; simple genetic algorithm; steady-state genetic algorithm; very large scale integrated design; Acceleration; Binary trees; Chip scale packaging; Circuit testing; Delay; Design optimization; Genetic algorithms; Optimization methods; Steady-state; Very large scale integration; Area Optimization; Genetic Algorithm; Simple Genetic Algorithm; Steady-State Algorithm; VLSI;
fLanguage
English
Publisher
ieee
Conference_Titel
Modeling & Simulation, 2008. AICMS 08. Second Asia International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-0-7695-3136-6
Electronic_ISBN
978-0-7695-3136-6
Type
conf
DOI
10.1109/AMS.2008.117
Filename
4530477
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