DocumentCode :
1586942
Title :
A 200-MHz CMOS Mixed-Mode Sample-and-Hold Circuit for Pipelined ADCs
Author :
Jiang, Shan ; Manh Anh Do ; Kiat Seng Yeo
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fYear :
2006
Firstpage :
352
Lastpage :
356
Abstract :
This paper presents the design of a high-speed CMOS sample-and-hold (S/H) circuit for pipelined analog-to-digital converters (ADCs). This S/H circuit employs a conventional switched-capacitor (SC) S/H and a built-in comparator to generate the mixed-mode sampled data output (which is represented both in analog and digital formation). Due to the mixed-mode sample-and-hold technique, this S/H circuit has a reduced output signal swing thus improves the speed and linearity compared to conventional S/H circuits. The aperture errors at high frequency are minimized by using time constants matching and digital error correction logic in pipelined ADCs. Designed in a 0.18mum CMOS technology, the proposed S/H circuit operates up to 200-MHz sampling with less than -53dB total harmonic distortion (THD) in the worst case corner simulation. The power consumption is less than 3.6-mW with 1.8-V supply voltage
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); mixed analogue-digital integrated circuits; sample and hold circuits; switched capacitor networks; 0.18 micron; 1.8 V; 200 MHz; 3.6 mW; CMOS mixed-mode sample-and-hold circuit; CMOS technology; aperture errors; built-in comparator; digital error correction logic; pipelined ADC; pipelined analog-to-digital converters; reduced output signal swing; switched capacitor; time constants matching; total harmonic distortion; worst case corner simulation; Analog-digital conversion; Apertures; CMOS analog integrated circuits; CMOS logic circuits; CMOS technology; Error correction; Frequency; Linearity; Sampling methods; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Very Large Scale Integration, 2006 IFIP International Conference on
Conference_Location :
Nice
Print_ISBN :
3-901882-19-7
Type :
conf
DOI :
10.1109/VLSISOC.2006.313260
Filename :
4107656
Link To Document :
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