Title :
Phase space engineering in optical microcavities II. controlling the far-field
Author :
Poirier, Julien ; Painchaud-April, Guillaume ; Gagnon, Denis ; Dubé, Louis J.
Author_Institution :
Dept. de Phys., de Genie Phys., et d´´Opt., Univ. Laval, Québec, QC, Canada
Abstract :
Optical microcavities support Whispering Gallery Modes (WGMs) with a very high quality factor Q. However, WGMs typically display a far-field isotropic emission profile and modifying this far-field profile without spoiling the associated high Q remains a challenge. Using a 2D annular cavity, we present a procedure capable to achieve these two apparently conflicting goals. With the correspondence between the classical and the wave picture, properties of the classical phase space shed some light on the characteristics of the wave dynamics. Specifically, the annular cavity has a well separated mixed phase space, a characteristic that proves to be of crucial importance in the emission properties of WGMs. While the onset of directionality in the far-field may be achieved through parametric deformation of the distance cavity-hole centers, d, this contribution presents a method to control the emission profile via a second parameter, the hole radius r0. The influence of the classical dynamics to control and predict the field emission will be demonstrated.
Keywords :
micro-optics; microcavities; optical resonators; whispering gallery modes; 2D annular cavity; distance cavity-hole centers; far-field isotropic emission profile; optical microcavities; phase space engineering; wave dynamics; whispering gallery modes; Dielectrics; Displays; Electronic mail; Microcavities; Optical control; Optical resonators; Q factor; Refractive index; Stimulated emission; Whispering gallery modes; Optical resonators; annular microcavities; classical versus wave dynamics; control of directional emission; microlasers; whispering-gallery mode;
Conference_Titel :
Transparent Optical Networks (ICTON), 2010 12th International Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-7799-9
Electronic_ISBN :
978-1-4244-7797-5
DOI :
10.1109/ICTON.2010.5549310