DocumentCode
1587077
Title
Phase space engineering in optical microcavities II. controlling the far-field
Author
Poirier, Julien ; Painchaud-April, Guillaume ; Gagnon, Denis ; Dubé, Louis J.
Author_Institution
Dept. de Phys., de Genie Phys., et d´´Opt., Univ. Laval, Québec, QC, Canada
fYear
2010
Firstpage
1
Lastpage
4
Abstract
Optical microcavities support Whispering Gallery Modes (WGMs) with a very high quality factor Q. However, WGMs typically display a far-field isotropic emission profile and modifying this far-field profile without spoiling the associated high Q remains a challenge. Using a 2D annular cavity, we present a procedure capable to achieve these two apparently conflicting goals. With the correspondence between the classical and the wave picture, properties of the classical phase space shed some light on the characteristics of the wave dynamics. Specifically, the annular cavity has a well separated mixed phase space, a characteristic that proves to be of crucial importance in the emission properties of WGMs. While the onset of directionality in the far-field may be achieved through parametric deformation of the distance cavity-hole centers, d, this contribution presents a method to control the emission profile via a second parameter, the hole radius r0. The influence of the classical dynamics to control and predict the field emission will be demonstrated.
Keywords
micro-optics; microcavities; optical resonators; whispering gallery modes; 2D annular cavity; distance cavity-hole centers; far-field isotropic emission profile; optical microcavities; phase space engineering; wave dynamics; whispering gallery modes; Dielectrics; Displays; Electronic mail; Microcavities; Optical control; Optical resonators; Q factor; Refractive index; Stimulated emission; Whispering gallery modes; Optical resonators; annular microcavities; classical versus wave dynamics; control of directional emission; microlasers; whispering-gallery mode;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks (ICTON), 2010 12th International Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-7799-9
Electronic_ISBN
978-1-4244-7797-5
Type
conf
DOI
10.1109/ICTON.2010.5549310
Filename
5549310
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