Title :
Antenna diversity for an OFDM system in a fading channel
Author :
Lee, Dennis ; Saulnier, Gary J. ; Ye, Zhong ; Medley, Michael J.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
This paper explores antenna diversity issues for orthogonal frequency division multiplexing (OFDM) in frequency flat and selective fading environment using three combining methods-maximal ratio combining (MRC), equal gain combining (EGC), and selection combining (SC). For OFDM, diversity combining can be done on individual subcarriers (narrowband combining) or on the entire OFDM symbol (wideband combining). For narrowband combining, OFDM diversity performance in a frequency selective channel can be predicted using flat fading analytic formulas, given that sub-channels are sufficiently narrowband. For wideband combining, an equivalent channel model based on the number of rays in the channel is formulated and an analytic expression for wideband SC is derived. Computer simulation is used to verify these expressions and methods to improve the three combining techniques are discussed, including metric filtering, selection grouping, and higher order selection diversity
Keywords :
OFDM modulation; diversity reception; fading channels; filtering theory; signal detection; OFDM; OFDM symbol; OFDM system; antenna diversity; coherent detection; computer simulation; differential detection; equal gain combining; equivalent channel model; fading channel; flat fading analytic formulas; frequency flat fading; higher order selection diversity; maximal ratio combining; metric filtering; narrowband combining; orthogonal frequency division multiplexing; selection combining; selection grouping; selective fading environment; subcarriers; subchannels; wideband combining; Diversity reception; Fading; Frequency diversity; HDTV; Narrowband; OFDM; Performance analysis; Streaming media; Tires; Wideband;
Conference_Titel :
Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5538-5
DOI :
10.1109/MILCOM.1999.821374