DocumentCode :
158758
Title :
The impact of capacitive switching condition on vacuum breakdown phenomena
Author :
Donen, Taiki ; Yano, Takao ; Tsukima, Mitsuru ; Miki, Shigehito
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
fYear :
2014
fDate :
Sept. 28 2014-Oct. 3 2014
Firstpage :
137
Lastpage :
140
Abstract :
In the case of switching capacitive loads, breakdown electric field of vacuum interrupter tends to decrease because contacts of vacuum interrupter are damaged by large making current. In this paper, the authors investigated the decreased breakdown electric field from the following two viewpoints. First, the relation between breakdown electric field and condition of opening operation was investigated. The breakdown electric field was invariant regardless of whether mechanical impact of opening operation was applied. On the other hand, the breakdown electric field tended to increase when opening operation was carried out with long arc time. These results indicate that the field emission mainly determine the breakdown phenomena. Secondly, the relation between breakdown electric field and making current was investigated. On the whole, the larger the amplitude of making current became, the lower breakdown electric field tended to be. However, the breakdown electric field was exceptionally high when the generation time of making current arc was long. This is because arc of making current diffused rapidly.
Keywords :
arcs (electric); electric fields; electrical contacts; field emission; vacuum breakdown; vacuum interrupters; breakdown electric field; capacitive switching condition; current arc; field emission; long arc time; mechanical impact; switching capacitive loads; vacuum breakdown phenomena; vacuum interrupter contacts; Current measurement; Electric fields; Interrupters; Vacuum breakdown; Voltage measurement; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4799-6750-6
Type :
conf
DOI :
10.1109/DEIV.2014.6961638
Filename :
6961638
Link To Document :
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