• DocumentCode
    158764
  • Title

    Interruption ability and restrike phenomenon of triggered vacuum switch with high frequency current

  • Author

    Minfu Liao ; Wenhao Li ; Xiping Jiang ; Guowei Ge ; Xiongying Duan

  • Author_Institution
    Sch. of Electr. Eng., Dalian Univ. of Technol., Dalian, China
  • fYear
    2014
  • fDate
    Sept. 28 2014-Oct. 3 2014
  • Firstpage
    161
  • Lastpage
    164
  • Abstract
    In recent years, pulse power technology is developing towards the goal of high working frequency. One of the key technologies involved is the development of high power repetitive short-circuit transition switches. The triggered vacuum switch (TVS) is promising in this field because of the excellent dielectric strength recovery property of vacuum. However, the high frequency current interruption ability and vacuum dielectric strength recovery characteristic of TVS with common electrode structure have not been known. In this paper, the TVS is tested under five different high oscillating frequencies. The results show that restrike time contains strong randomness. The restrike probability is increasing with the increase of rate of current change when it passes zero. And with the increase of oscillating frequency, the interruption ability of TVS becomes weak. All these will help the development of high power repetitive short-circuit transition switches.
  • Keywords
    electrodes; power supply quality; probability; pulsed power supplies; restriking voltage; vacuum switches; TVS; dielectric strength recovery property; electrode structure; high power repetitive short-circuit transition switches; interruption ability; oscillating frequencies; pulse power technology; restrike phenomenon; restrike probability; triggered vacuum switch; Discharges (electric); Electrodes; Interrupters; Switches; Vacuum technology; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4799-6750-6
  • Type

    conf

  • DOI
    10.1109/DEIV.2014.6961644
  • Filename
    6961644