• DocumentCode
    1587956
  • Title

    Modeling methodology of integrated five-port balun using two-port RF measurement

  • Author

    Huang, Kai-Ye ; Hsu, Chia-Jen ; Leu, Len-Yi

  • Author_Institution
    Winbond Electron. Corp., Hsinchu, Taiwan
  • fYear
    2005
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    A comprehensive investigation of RF characteristics and RF modeling methodology of an integrated transformer/balun, fabricated by a 0.18 μm mixed signal process, are presented. We proposed an improved lumped-element equivalent circuit and a three-step method to characterize and model the five-port balun by using a standard two-port RF measurement. The frequency dependence of inductance and resistance resulted from skin effects, proximity effects, and eddy current loss is considered in the lumped-element model. Both inverting and noninverting configuration were examined to enhance the model accuracy. The fitting results have good agreement with measurements over the frequency range of 0.1-6 GHz.
  • Keywords
    baluns; eddy current losses; equivalent circuits; high-frequency transformers; lumped parameter networks; mixed analogue-digital integrated circuits; multiport networks; skin effect; 0.1 to 6 GHz; 0.18 micron; RF modeling methodology; eddy current loss; inductance frequency dependence; integrated five-port balun; integrated transformer/balun; inverting configuration; lumped-element equivalent circuit; mixed signal process; noninverting configuration; proximity effects; resistance frequency dependence; skin effects; two-port RF measurement; Electrical resistance measurement; Equivalent circuits; Frequency dependence; Impedance matching; Inductance; Integrated circuit measurements; Measurement standards; RF signals; Radio frequency; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-8983-2
  • Type

    conf

  • DOI
    10.1109/RFIC.2005.1489789
  • Filename
    1489789