DocumentCode
158830
Title
Resistance increase of vacuum interrupters due to high-current interruptions
Author
Dullni, E. ; Gentsch, Dietmar ; Delachaux, Th ; Shang, W.
Author_Institution
ABB AG PPMV, Ratingen, Germany
fYear
2014
fDate
Sept. 28 2014-Oct. 3 2014
Firstpage
405
Lastpage
408
Abstract
The resistance of vacuum interrupters can be calculated from the geometry and resistivity of current carrying parts and the additional resistance of the contact points between movable and fixed contacts. Since vacuum interrupter contacts are designed as flat contacts facing each other, the resistance is mainly determined by contact force, hardness and resistivity of the contact material. It is known that the contact material changes consistency and structure during short-circuit interruptions within melting depth. Indeed, the overall resistance of a vacuum interrupter has been observed to increase by up to 50% after short-circuit making and breaking tests. Since the resistance increase across the switching device is considered by IEC and IEEE standards as one of the acceptance criteria for the integrity of the interrupter after tests, it is essential to understand the origin of this increase. Different causes are discussed, among them the change of grain structure, increasing resistivity and hardness, and change in material composition. Also, it is investigated whether the resistance increase can be affected, for example, by the flow of continuous current over the closed contacts.
Keywords
IEC standards; IEEE standards; short-circuit currents; vacuum interrupters; IEC standards; IEEE standards; contact material hardness; contact material resistivity; contact points; grain structure; high-current interruptions; melting depth; short-circuit interruptions; vacuum interrupter contacts; Conductivity; Contacts; Force; Interrupters; Materials; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
Conference_Location
Mumbai
Print_ISBN
978-1-4799-6750-6
Type
conf
DOI
10.1109/DEIV.2014.6961705
Filename
6961705
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