Title :
Angular acceleration measurement: a review
Author :
Ovaska, Seppo J. ; Väliviita, Sami
Author_Institution :
Inst. of Intelligent Power Electron., Helsinki Univ. of Technol., Espoo, Finland
Abstract :
This paper gives a review of sensors, methods, and algorithms available for the measurement of angular acceleration. The emphasis is in delay-sensitive, real-time applications. Although the angular acceleration can be measured indirectly using either a rotating angle sensor or a velocity sensor, the noise-amplification problem related to the differentiation process has motivated the efforts to develop transducers for direct sensing of angular acceleration. Direct measuring of linear acceleration is widely in everyday use, but the angular acceleration sensors, particularly those with unlimited rotation angle, can still be considered as emerging devices. Consequently, there exist two principal challenges for the research and development community: to develop economical and accurate angular accelerometers with unlimited rotation range, and to create wideband indirect techniques with small lag and high signal-to-error ratio
Keywords :
acceleration control; acceleration measurement; accelerometers; angular velocity measurement; measurement errors; observers; reviews; sensors; servomechanisms; state feedback; acceleration control; algorithms; angular acceleration measurement; angular accelerometers; delay-sensitive real-time applications; differentiation process; direct sensing transducers; feedback signal; high signal-to-error ratio; linear state observing; measurement errors; noise-amplification problem; polynomial predictive filter; predictive post-filtering; sensors; servo control; small lag; unlimited rotation range; wideband indirect technique; Acceleration; Accelerometers; Delay; Noise measurement; Particle measurements; Research and development; Rotation measurement; Transducers; Velocity measurement; Wideband;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.676850