DocumentCode :
1588406
Title :
Sampling biases in IP topology measurements
Author :
Lakhina, Anukool ; Byers, John W. ; Crovella, Mark ; Xie, Peng
Author_Institution :
Dept. of Comput. Sci., Boston Univ., MA, USA
Volume :
1
fYear :
2003
Firstpage :
332
Abstract :
Considerable attention has been focused on the properties of graphs derived from Internet measurements. Router-level topologies collected via traceroute-like methods have led some to conclude that the router graph of the Internet is well modeled as a power-law random graph. In such a graph, the degree distribution of nodes follows a distribution with a power-law tail. We argue that the evidence to date for this conclusion is at best insufficient We show that when graphs are sampled using traceroute-like methods, the resulting degree distribution can differ sharply from that of the underlying graph. For example, given a sparse Erdos-Renyi random graph, the subgraph formed by a collection of shortest paths from a small set of random sources to a larger set of random destinations can exhibit a degree distribution remarkably like a power-law. We explore the reasons for how this effect arises, and show that in such a setting, edges are sampled in a highly biased manner. This insight allows us to formulate tests for determining when sampling bias is present. When we apply these tests to a number of well-known datasets, we find strong evidence for sampling bias.
Keywords :
IP networks; Internet; graph theory; network topology; sampling methods; telecommunication network routing; IP topology measurement; Internet measurement; Internet router graph; graph property; highly biased edge sampling; larger set random destination; node degree distribution; power-law; router-level topology; sampled graph; sampling bias; shortest path collection subgraph; small set random source; sparse Erdos-Renyi random graph; traceroute-like method; Assembly; Computer science; Frequency; Internet; Network topology; Optical reflection; Probability distribution; Probes; Sampling methods; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
INFOCOM 2003. Twenty-Second Annual Joint Conference of the IEEE Computer and Communications. IEEE Societies
ISSN :
0743-166X
Print_ISBN :
0-7803-7752-4
Type :
conf
DOI :
10.1109/INFCOM.2003.1208685
Filename :
1208685
Link To Document :
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