• DocumentCode
    1588406
  • Title

    Sampling biases in IP topology measurements

  • Author

    Lakhina, Anukool ; Byers, John W. ; Crovella, Mark ; Xie, Peng

  • Author_Institution
    Dept. of Comput. Sci., Boston Univ., MA, USA
  • Volume
    1
  • fYear
    2003
  • Firstpage
    332
  • Abstract
    Considerable attention has been focused on the properties of graphs derived from Internet measurements. Router-level topologies collected via traceroute-like methods have led some to conclude that the router graph of the Internet is well modeled as a power-law random graph. In such a graph, the degree distribution of nodes follows a distribution with a power-law tail. We argue that the evidence to date for this conclusion is at best insufficient We show that when graphs are sampled using traceroute-like methods, the resulting degree distribution can differ sharply from that of the underlying graph. For example, given a sparse Erdos-Renyi random graph, the subgraph formed by a collection of shortest paths from a small set of random sources to a larger set of random destinations can exhibit a degree distribution remarkably like a power-law. We explore the reasons for how this effect arises, and show that in such a setting, edges are sampled in a highly biased manner. This insight allows us to formulate tests for determining when sampling bias is present. When we apply these tests to a number of well-known datasets, we find strong evidence for sampling bias.
  • Keywords
    IP networks; Internet; graph theory; network topology; sampling methods; telecommunication network routing; IP topology measurement; Internet measurement; Internet router graph; graph property; highly biased edge sampling; larger set random destination; node degree distribution; power-law; router-level topology; sampled graph; sampling bias; shortest path collection subgraph; small set random source; sparse Erdos-Renyi random graph; traceroute-like method; Assembly; Computer science; Frequency; Internet; Network topology; Optical reflection; Probability distribution; Probes; Sampling methods; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INFOCOM 2003. Twenty-Second Annual Joint Conference of the IEEE Computer and Communications. IEEE Societies
  • ISSN
    0743-166X
  • Print_ISBN
    0-7803-7752-4
  • Type

    conf

  • DOI
    10.1109/INFCOM.2003.1208685
  • Filename
    1208685