Title :
Thickness precision measurement method of sheath and insulation materials based on image processing
Author :
Shulan, Xia ; Jilin Wang
Author_Institution :
Dept. of Exp. Teaching, Yancheng Inst. of Technol., Yancheng, China
Abstract :
Subpixel is a key technology of image processing technology. It can achieve positioning better than entire pixel precision to the target. Against the shortcoming of slow speed of general Zernike moment subpixel location method, proposed an improved Sobel-Zernike moment positioning method in the software algorithms of sheath and insulation materials thickness image measurement system, improved the edge point criterion and the edge subpixel coordinates formula, optimized the edge of a single pixel contour, achieved precise and rapid measurements, and the experiment display is faster than 80%.
Keywords :
Zernike polynomials; edge detection; image processing; insulating materials; thickness measurement; Sobel-Zernike moment positioning method; edge point criterion; edge subpixel coordinates formula; general Zernike moment subpixel location method; image processing; insulation materials; sheath; software algorithms; thickness precision measurement method; Accuracy; Image edge detection; Instruments; Materials; Mathematical model; Moment methods; Thickness measurement; Sheath; Sobel-Zernike moment method; image processing; insulation materials; sub-pixel;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037849
