Thickness precision measurement method of sheath and insulation materials based on image processing

Author

Shulan, Xia ; Jilin Wang

Author_Institution

Dept. of Exp. Teaching, Yancheng Inst. of Technol., Yancheng, China

Volume

3

fYear

2011

Firstpage

33

Lastpage

37

Abstract

Subpixel is a key technology of image processing technology. It can achieve positioning better than entire pixel precision to the target. Against the shortcoming of slow speed of general Zernike moment subpixel location method, proposed an improved Sobel-Zernike moment positioning method in the software algorithms of sheath and insulation materials thickness image measurement system, improved the edge point criterion and the edge subpixel coordinates formula, optimized the edge of a single pixel contour, achieved precise and rapid measurements, and the experiment display is faster than 80%.

Keywords

Zernike polynomials; edge detection; image processing; insulating materials; thickness measurement; Sobel-Zernike moment positioning method; edge point criterion; edge subpixel coordinates formula; general Zernike moment subpixel location method; image processing; insulation materials; sheath; software algorithms; thickness precision measurement method; Accuracy; Image edge detection; Instruments; Materials; Mathematical model; Moment methods; Thickness measurement; Sheath; Sobel-Zernike moment method; image processing; insulation materials; sub-pixel;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-8158-3

Type

conf

DOI

10.1109/ICEMI.2011.6037849

Filename

6037849