Title :
Gateless-FET undoped AlGaN/GaN HEMT structure for liquid-phase sensor
Author :
Abidin, Mastura Shafinaz Zainal ; Sharifabad, Maneea Eizadi ; Hashim, Abdul Manaf ; Rahman, S.F.A. ; Rahman, Abdur R. A. ; Qindeel, Rabia ; Omar, Nurul Afzan ; Aziz, Aznita Abdul ; Hashim, Md Roslan ; Mohamed, Magdy Hussien Mourad
Author_Institution :
Mater. Innovations & Nanoelectron. Res. Group, Univ. Teknol. Malaysia, Skudai, Malaysia
Abstract :
A gateless field-effect-transistor (FET) device fabricated on undoped AlGaN/GaN high-electron-mobility-transistor (HEMT) structure is investigated as a liquid-phase sensor. Good gate controllability for typical current-voltage (I-V) characteristics of FET is observed. This result shows that an undoped-AlGaN surface at the open-gate area is effectively controlled by the isolated gate voltage via chemical solution. Stable pH sensing operation in aqueous solution is observed where this device exhibits a high linear sensitivity of 3.88 mA/mm/pH at drain-source voltage, VDS = 5 V. Due to the occurrence of large leakage current, the Nernstian´s like sensitivity is not observed. It is also found that the device is sensitive to changes in electrostatic boundary conditions of the polar liquids. This indicates that the change in dipole moment in each liquid causes the potential change at AlGaN surface.
Keywords :
aluminium compounds; gallium compounds; high electron mobility transistors; current-voltage characteristics; drain-source voltage; electrostatic boundary conditions; gate controllability; gateless field-effect-transistor device; gateless-FET undoped AlGaN/GaN HEMT structure; high-electron-mobility-transistor; liquid-phase sensor; stable pH sensing; Aluminum gallium nitride; Chemical sensors; Controllability; Electrostatics; FETs; Gallium nitride; HEMTs; Leakage current; Sensor phenomena and characterization; Voltage control;
Conference_Titel :
Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-6608-5
DOI :
10.1109/SMELEC.2010.5549371