DocumentCode
1589154
Title
Test generation for networks of interacting FSMs using symbolic techniques
Author
Ferrandi, F. ; Fummi, F. ; Macii, E. ; Poncino, M. ; Sciuto, D.
Author_Institution
Dipartimento di Elettronica, Politecnico di Milano, Italy
fYear
1996
Firstpage
208
Lastpage
213
Abstract
This paper presents a new testing strategy for networks of interacting FSMs. The approach allows us to generate test patterns for faults in the network by separately handling the network´s components. The proposed algorithms are fully symbolic; therefore, they allow the manipulation of large designs. Experimental results, though preliminary, are promising
Keywords
Boolean functions; fault diagnosis; finite state machines; logic testing; symbol manipulation; faults; interacting FSMs; symbolic techniques; test generation; test patterns; testing strategy; Algorithm design and analysis; Automata; Automatic testing; Boolean functions; Circuit faults; Circuit testing; Data structures; Logic testing; State-space methods; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on
Conference_Location
Ames, IA
ISSN
1066-1395
Print_ISBN
0-8186-7502-0
Type
conf
DOI
10.1109/GLSV.1996.497621
Filename
497621
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