Title :
Dynamic deformation of a solenoid wire due to internal magnetic pressure
Author :
Ruden, E.L. ; Kiuttu, G.F. ; Frese, M.H. ; Frese, S.D.
Author_Institution :
Directed Energy Directorate, Air Force Res. Lab., Kirtland AFB, NM, USA
Abstract :
Deformation of the wire used in the solenoidal windings of an inertially confined pulsed high magnetic field generator is potentially the limiting factor for the magnitude and duration of the magnetic field produced. The rising magnetic pressure at the wire surface can become large enough to cause the cross section of the wire to deform on a time scale shorter than overall solenoid disassembly time. This may result in short circuiting due to insulator breakage and/or physical contact of adjacent windings. An analytic approximation modeling the deformation dynamics is presented which takes into account both inertial and material yield strength effects. The model is validated by comparison to two dimensional magnetohydrodynamic simulations of the process by Numerex´s MS Windows version of AFRL´s MACH2. Cases where yield strength has a negligible effect on the deformation, and where yield strength is significant are considered.
Keywords :
deformation; exploding wires; magnetic fields; magnetohydrodynamics; power engineering computing; pulsed power supplies; solenoids; wires (electric); yield strength; AFRL MACH2; Numerex MS Windows version; adjacent windings contact; deformation dynamics modeling; dynamic deformation; inertial yield strength; inertially confined pulsed high magnetic field generator; insulator breakage; internal magnetic pressure; magnetic field; material yield strength; rising magnetic pressure; short circuiting; solenoid disassembly time; solenoid wire; two dimensional magnetohydrodynamic simulations; wire surface; Circuits; Deformable models; Inertial confinement; Insulation; Magnetic analysis; Magnetic confinement; Magnetic fields; Pulse generation; Solenoids; Wire;
Conference_Titel :
Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7120-8
DOI :
10.1109/PPPS.2001.1002042