Title :
Thermal performance of plastic-encapsulated and hermetically sealed components for automotive applications
Author :
Musiejovsky, L. ; Nicolics, J. ; Hauser, H. ; Brasseu, G.
Author_Institution :
Inst. of Mater. Sci. for Electr. Eng., Tech. Univ. Wien, Austria
Abstract :
In automotive applications reliability and lifetime of electronic components are mainly influenced by aging processes related to superposing effects of mechanical vibrations, thermomechanically induced stress and thermal load. Two of these factors can be minimized by optimizing the component´s thermal design. In this work measured and simulated thermal qualities of plastic-encapsulated and ceramic packages are compared. The experimental test procedure and main features of a new thermal simulation tool especially designed for the prediction of thermal characteristics of mono-chip and multi-chip components are discussed. Although, the thermal conductivity of ceramic is high compared to plastic moldings our results clearly show that plastic packages can compete with their ceramic counterparts
Keywords :
automotive electronics; failure analysis; integrated circuit packaging; integrated circuit reliability; multichip modules; plastic packaging; thermal stresses; IC components; TRESCOM tool; automotive applications; ceramic packages; die bonding failures; electronic components lifetime; hermetically sealed components; mono-chip components; multi-chip components; plastic-encapsulated components; reliability; thermal conductivity; thermal load; thermal performance; thermal simulation tool; thermomechanically induced stress; Aging; Automotive applications; Ceramics; Electronic components; Electronic packaging thermal management; Hermetic seals; Plastic packaging; Thermal conductivity; Thermal stresses; Vibrations;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.676911