DocumentCode :
159002
Title :
EMI generation characteristics of SiC diodes: Influence of reverse recovery characteristics
Author :
Walder, Sam ; Yuan, Xibo ; Oswald, Niall
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK
fYear :
2014
fDate :
8-10 April 2014
Firstpage :
1
Lastpage :
6
Abstract :
In this paper the influence of silicon carbide (SiC) diodes on electromagnetic interference (EMI) generation in hard-switched power converters is investigated. The absence of reverse-recovery behaviour in these devices is expected to result in reduced EMI generation, in addition to significantly reducing switching losses. A simplified analytical model enabling the spectral envelope of the diode current waveform to be predicted is presented and numerical simulation is employed to validate this model. It is found that reverse-recovery characteristics have greatest influence on the spectral content of the simulated diode current waveforms at frequencies above 10 MHz. Experimental measurements of switching current waveforms for both conventional Silicon (Si) diode and SiC diodes are presented and their frequency spectra are compared with the results of the numerical and analytical models.
Keywords :
electromagnetic interference; elemental semiconductors; power semiconductor diodes; silicon; EMI generation; SiC; diode current waveform; electromagnetic interference generation; hard-switched power converter; reduced EMI generation; reverse recovery characteristics; silicon carbide diode; Silicon Carbide; diodes; electromagnetic compatibility; electromagnetic interference;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Power Electronics, Machines and Drives (PEMD 2014), 7th IET International Conference on
Conference_Location :
Manchester
Electronic_ISBN :
978-1-84919-815-8
Type :
conf
DOI :
10.1049/cp.2014.0447
Filename :
6836836
Link To Document :
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