• DocumentCode
    159002
  • Title

    EMI generation characteristics of SiC diodes: Influence of reverse recovery characteristics

  • Author

    Walder, Sam ; Yuan, Xibo ; Oswald, Niall

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK
  • fYear
    2014
  • fDate
    8-10 April 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper the influence of silicon carbide (SiC) diodes on electromagnetic interference (EMI) generation in hard-switched power converters is investigated. The absence of reverse-recovery behaviour in these devices is expected to result in reduced EMI generation, in addition to significantly reducing switching losses. A simplified analytical model enabling the spectral envelope of the diode current waveform to be predicted is presented and numerical simulation is employed to validate this model. It is found that reverse-recovery characteristics have greatest influence on the spectral content of the simulated diode current waveforms at frequencies above 10 MHz. Experimental measurements of switching current waveforms for both conventional Silicon (Si) diode and SiC diodes are presented and their frequency spectra are compared with the results of the numerical and analytical models.
  • Keywords
    electromagnetic interference; elemental semiconductors; power semiconductor diodes; silicon; EMI generation; SiC; diode current waveform; electromagnetic interference generation; hard-switched power converter; reduced EMI generation; reverse recovery characteristics; silicon carbide diode; Silicon Carbide; diodes; electromagnetic compatibility; electromagnetic interference;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Power Electronics, Machines and Drives (PEMD 2014), 7th IET International Conference on
  • Conference_Location
    Manchester
  • Electronic_ISBN
    978-1-84919-815-8
  • Type

    conf

  • DOI
    10.1049/cp.2014.0447
  • Filename
    6836836