Title :
Fast and Accurate Estimate SET Voltage Pulses from Transient Currents Induced by Heavy Ion
Author :
Biwei, Liu ; Shuming, Chen
Author_Institution :
Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Washington, DC
Abstract :
Soft error induced by SET (single event transient) has been more and more substantial. Previously SET transient current has been careful measure and modeled. However the voltage pulse is more concerned in SET analyze and it is difficult to be measured directly. In this paper, we deduce the relationship between current pulse and voltage pulse and present a numerical technique to accurately estimate transient voltage pulses from measured transient current. The method is validated through device simulation. Experiment results show our method agrees with device simulation, while speed is much faster.
Keywords :
circuit simulation; estimation theory; transient analysis; SET transient current; current pulse; device simulation; heavy ion; single event transient; transient voltage pulse; Acceleration; Arithmetic; Current measurement; Equations; Error analysis; Inverters; Logic devices; MOS devices; Pulse measurements; Voltage; SET; radiation effect; voltage pulse;
Conference_Titel :
Modeling & Simulation, 2008. AICMS 08. Second Asia International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-0-7695-3136-6
Electronic_ISBN :
978-0-7695-3136-6
DOI :
10.1109/AMS.2008.165
