Title :
ADC nonlinearities and harmonic distortion in FFT test
Author :
Bellan, D. ; Brandolini, A. ; Gandelli, A.
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
Abstract :
This paper deals with the analysis of harmonic distortion in uniform and nonuniform analog-to-digital converters (ADC), when the test signal is a pure sine wave. Mathematical relationships between harmonic distortion, input signal parameters and ADC nonlinearity errors are derived Finally, numerical simulations of A/D processes validate the analytical results
Keywords :
analogue-digital conversion; circuit analysis computing; digital simulation; fast Fourier transforms; harmonic distortion; integrated circuit testing; A/D process simulation; ADC nonlinearities; FFT test; harmonic distortion; input signal parameters; nonlinearity errors; nonuniform convertors; numerical simulation; test signal; uniform convertors; Analog-digital conversion; Analytical models; Harmonic analysis; Harmonic distortion; Numerical simulation; Quantization; Shape; Signal analysis; Signal processing; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.676921
