Title :
Combinationally irredundant ISCAS-89 benchmark circuits
Author :
Kajihara, Seiji ; Kinoshita, Kozo ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Appl. Phys., Osaka Univ., Japan
Abstract :
We describe a procedure to remove combinationally redundant faults from a sequential circuit. The procedure removes gates, primary inputs, primary outputs and flip-flops, such that the resulting circuit is equivalent to the original circuit (by the definition given in a previous work). We present experimental results of the application of this procedure to ISCAS-89 benchmark circuits. The resulting circuits are available through anonymous ftp from ftp.eng.uiowa.edu in directory “pub/reddy/irrckts”
Keywords :
fault diagnosis; logic testing; redundancy; sequential circuits; ISCAS-89 benchmark circuits; combinationally redundant faults; flip-flops; gates; primary inputs; primary outputs; sequential circuits; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Flip-flops; Logic testing; Physics; Sequential circuits;
Conference_Titel :
Circuits and Systems, 1996. ISCAS '96., Connecting the World., 1996 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3073-0
DOI :
10.1109/ISCAS.1996.542103