DocumentCode :
1590431
Title :
Comparative study of X-parameters and nonlinear scattering functions
Author :
Qinglong, Zhang ; Shengli, Liang
Author_Institution :
Sci. & Technol. on Electron. Test & Meas. Lab., Qingdao, China
Volume :
3
fYear :
2011
Firstpage :
355
Lastpage :
358
Abstract :
S-parameters have been used in analyzing linear networks for more than half a century. Despite the great success of S-parameters, they are severely limited. In fact in real world, all systems are nonlinear. It´s a hard work to characterizing the nonlinear network and thus it becomes a hot issue today. This article introduces two methods of nonlinear modeling, X-parameters and scattering functions. We give a conclusion on the relation of these two methods after comparing their basic concept and extraction systems. At the end of this paper, we present an extraction system which can adopt either X-parameters or Scattering functions for the nonlinear characterizing and modeling.
Keywords :
S-parameters; network analysers; S-parameters; X-parameter comparative study; extraction systems; linear networks analysis; nonlinear modeling; nonlinear network; nonlinear scattering functions; Harmonic analysis; Mathematical model; Microwave amplifiers; Microwave integrated circuits; Microwave measurements; Scattering; X-parameters; describing functions; network analyzer; nonlinear; scattering functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
Type :
conf
DOI :
10.1109/ICEMI.2011.6037923
Filename :
6037923
Link To Document :
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