Title :
Model-based fault detection in multi-sensor measurement systems
Author :
Lughofer, Edwin ; Klement, Erich Peter ; Lujan, J.M. ; Guardiola, Carlos
Author_Institution :
Dept. of Knowledge-based Math. Syst., Johannes Kepler Univ., Linz, Austria
Abstract :
In the process and manufacturing industries, there has been a large push to produce higher quality products, reduce product rejection rates, and satisfy increasingly forceful safety and environmental regulations. Hence, the increasing complexity of measurement systems inside modern industrial processes with a rising number of actuators and sensors demands automatic fault detection algorithms which can cope with a huge number of variables and high-frequency dynamic data. Indeed, humans are able to classify sensor signals by inspecting by-passing data, but these classifications are very time-consuming and also have deficiencies because of underlying vague expert knowledge consisting of low-dimensional mostly linguistic relationships. In this paper we propose a model-based fault detection algorithm, which is generic in the sense that any model correctly describing a functional dependency inside a system can be enclosed easily almost without adjusting any thresholds or other essential parameters. This advanced ´residual view´ fault detection includes aspects for incorporating sensor inaccuracies and model qualities as well as processing further normalized residuals for obtaining fault probabilities. Validation results with respect to data coming from engine test benches are included.
Keywords :
automatic testing; benchmark testing; fault diagnosis; manufacturing industries; measurement systems; sensor fusion; engine test bench; expert knowledge; fault probabilities; functional dependency; industrial processes; linguistic relationships; manufacturing industries; measurement complexity; model based fault detection; multi-sensor measurement systems; process industries; product quality; product rejection rates; Actuators; Automatic testing; Fault detection; Force measurement; Logic testing; Manufacturing industries; Mathematical model; Product safety; Sensor systems; System testing;
Conference_Titel :
Intelligent Systems, 2004. Proceedings. 2004 2nd International IEEE Conference
Print_ISBN :
0-7803-8278-1
DOI :
10.1109/IS.2004.1344662