Title :
Energy propagation properties of Al-lossy lines in high-speed circuits on silicon substrate
Author :
Gospodinova-Daltcheva, Minka ; Arnaudov, Radosvet ; Philippov, Philip
Author_Institution :
Dept. of Microelectron., Sofia Tech. Univ., Bulgaria
fDate :
6/21/1905 12:00:00 AM
Abstract :
This paper presents a discussion on the analysis and modelling of energy propagation of Al-interconnects on silicon substrate. A superposition of a DC biasing to the high-speed signal applied to the line is suggested. To provide the characterization of this effect a number of test structures containing a variety of asymmetric transmission lines were prepared. S-parameters data were measured using a vector network analyser and the measured data were compared to theoretical predictions. TEM-wave propagation was considered. The obtained results show a certain change in energy propagation while changing the value of DC biasing voltage. The obtained results suggest a way of controlling the performance and energy propagation of interconnects on semiconductor substrates. The method can be applied to coupled lines as well
Keywords :
aluminium; coupled transmission lines; crosstalk; high-speed integrated circuits; integrated circuit interconnections; integrated circuit modelling; transmission line theory; Al-Si; Al-interconnects; Al-lossy lines; DC biasing; S-parameters; Si substrate; TEM-wave propagation; asymmetric transmission lines; crosstalk; delay; distortion; distributed RLCG model; energy propagation properties; high-frequency effects; high-speed circuits; high-speed silicon integrated circuits; interconnection lossy line performance; test structures; vector network analyser; Capacitance; Crosstalk; Dielectric materials; Frequency; High speed integrated circuits; Integrated circuit interconnections; Propagation losses; Silicon; Substrates; Transmission line theory;
Conference_Titel :
High Performance Electron Devices for Microwave and Optoelectronic Applications, 1999. EDMO. 1999 Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-5298-X
DOI :
10.1109/EDMO.1999.821501