Title :
Research of fault diagnosis based on rough sets and support vector machine
Author :
Anli, Du ; Yingchun, Wang ; Jie, Wang ; Jiajun, Hua ; Mengguo, Shao
Author_Institution :
Missile Inst. of Air Force Eng. Univ., Sanyuan, China
Abstract :
It is lack of fault samples and the feature information is miscellaneous and redundant in complex circuit system. In order to solve the problem, a new fault diagnosis method was presented based on rough set (RS) and support vector machine (SVM). The RS was applied to discrete sample data the genetic algorithm (GA) was used to reduce the redundant attributes and the conflicting samples. Then the simplest fault attributes were extracted as the training samples for SVM, which was used as the classifier to isolate the faults rapidly. The simulated experiments demonstrated that the method is valid and feasible under the condition of small samples.
Keywords :
circuit analysis computing; fault diagnosis; genetic algorithms; rough set theory; support vector machines; complex circuit system; discrete sample data; fault attributes; fault diagnosis; genetic algorithm; rough sets; support vector machine; Capacitance; Circuit faults; Decision making; Fault diagnosis; Rough sets; Support vector machines; Vectors; fault diagnosis; genetic algorithm; rough sets; support vector machine;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037958