Title :
Power cycling testing with different load pulse durations
Author :
Scheuermann, Uwe ; Schmidt, R. ; Newman, Paul
Author_Institution :
SEMIKRON Elektron. GmbH & Co. KG, Nürnberg, Germany
Abstract :
For many applications, the impact on the component lifetime of temperature swings generated by low output frequency is of special interest. Therefore, active power cycling tests with a variation of load pulse duration were conducted. The requirements for the active power cycling test equipment related to load pulse durations down to 70ms will be discussed. The analysis of the test results leads to the proposal of a new empirical lifetime model for advanced power modules, which explicitly contains the impact of the load pulse duration. These reliability results will affect the design of advanced inverters with low frequency output currents.
Keywords :
electronic equipment testing; invertors; load (electric); test equipment; active power cycling test equipment; advanced power modules; empirical lifetime model; inverters; load pulse duration; Reliability; lifetime estimation; lifetime model; power modules;
Conference_Titel :
Power Electronics, Machines and Drives (PEMD 2014), 7th IET International Conference on
Conference_Location :
Manchester
Electronic_ISBN :
978-1-84919-815-8
DOI :
10.1049/cp.2014.0475