DocumentCode :
1591396
Title :
Research on device and method of vision inspection of a vehicle dashboard framework
Author :
An, Cui ; Cheng, Zhang ; Dapeng, He ; Xiaobo, Chen
Author_Institution :
State Key Lab. of Automotive Dynamic Simulation, Jilin Univ., Changchun, China
Volume :
4
fYear :
2011
Firstpage :
150
Lastpage :
154
Abstract :
Computer vision inspection possess the advantages of high speed, high accuracy, excellent flexibility and so on, which has been applied extensively in lots of fields of industrial product inspection. The advanced inspection techniques and inspection methods of manufacturing enterprises for automobile have become an important factor which restrains the automation of automobile manufacturing and quality improvement of auto products. Based on the manufacturing quality problems of vehicle dashboard framework and the weaknesses existing in traditional manual inspection method, a scheme of vision inspection is proposed in this paper aiming at columnar dashboard framework, and a novel device for detection and location is designed. In the mean time great researches on critical technologies and methods of detection have been made. The analysis of experimental results indicates that the error of the vision inspection system developed in this paper is less than 0.1mm, which exhibits a higher precision relatively. And the inspecting time is below 1.5min per piece, which satisfies the requirements of production online inspection and improves the inspecting efficiency remarkably.
Keywords :
automatic optical inspection; automobile manufacture; automotive components; computer vision; production engineering computing; quality control; automobile manufacturing enterprises; computer vision inspection; industrial product inspection; production online inspection; quality improvement; vehicle dashboard framework; Calibration; Cameras; Educational institutions; Image edge detection; Inspection; Instruments; Manufacturing; camera calibration; dashboard framework; image processing; location device; vision inspection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
Type :
conf
DOI :
10.1109/ICEMI.2011.6037967
Filename :
6037967
Link To Document :
بازگشت