Title :
Study of digital Gaussian shaping for a semiconductor X-ray detector in real time
Author :
Jianbin, Zhou ; Wei, Zhou ; Fang, Fang ; Yi, Liu ; Xing, Zhu
Author_Institution :
Inst. of Nucl., Chengdu Univ. of Technol., Chengdu, China
Abstract :
A novel algorithm of digital Gaussian shaping for a semiconductor X-ray detector in real time is presented in this paper in details. The algorithm is established between the input signal and the output signal basing on Sallen-Key filter and Kirchhoff Current Law. And it is a second order non-homogeneous differential equation. Then a general numerical recursive root is obtained by applying numerical differentiation method. And digital Gaussian filtering of a standard exponential-decaying signal and a nuclear pulse signal are implemented as well. Lastly, depending on software simulation, the shaping operators are confirmed. Preliminary experimental tests show potential advantages of using these techniques in energy dispersive X-ray fluorescence system.
Keywords :
Gaussian processes; X-ray chemical analysis; X-ray detection; differential equations; Kirchhoff Current Law; Sallen Key filter; digital Gaussian filtering; digital Gaussian shaping; energy dispersive X-ray fluorescence system; nuclear pulse signal; numerical differentiation method; output signal basing; recursive root; second order nonhomogeneous differential equation; semiconductor X ray detector; shaping operators; software simulation; standard exponential decaying signal; Detectors; Equations; Filtering theory; Low pass filters; Mathematical model; Signal processing algorithms; Software algorithms; Kirchhoff current law; digital Gaussian shaping; numerical differentiation algorithm; sallen-key filter;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037970
