• DocumentCode
    1591551
  • Title

    A Simulated Annealing Technique for Optimizing Time Warp Simulation

  • Author

    Zhang, Wei ; Meraji, Sina ; Wang, Jun ; Tropper, Carl

  • Author_Institution
    Nat. Lab. for Parallel & Distrib. Process., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    2
  • fYear
    2010
  • Firstpage
    197
  • Lastpage
    201
  • Abstract
    According to Moore´s law the complexity of VLSI circuits has doubled approximately every two years, resulting in simulation becoming the major bottleneck in the circuit design process. Parallel and distributed simulations can be applied as fast, cost effective approaches to the simulation of large, complex circuits. In this paper, a simple yet effective simulated annealing-based approach is proposed to optimize the choice of a time window for optimistic parallel simulation. We chose gate level circuits simulations as our experimental vehicle. Our results show up to a 52% improvement in the simulation time using our simulated annealing algorithm. To the best of our knowledge, this is the first time that SA has been applied to optimize the performance of time warp simulations.
  • Keywords
    VLSI; hardware description languages; integrated circuit design; simulated annealing; time warp simulation; Moore law; VLSI circuits; circuit design; gate level circuits simulations; optimistic parallel simulation; optimization; simulated annealing; time warp simulation; Circuit simulation; Computational modeling; Computer science; Computer simulation; Concurrent computing; Discrete event simulation; Hardware design languages; Simulated annealing; Time warp simulation; Voltage control; distributed simulation; simulated annealing; time warp;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Modeling and Simulation, 2010. ICCMS '10. Second International Conference on
  • Conference_Location
    Sanya, Hainan
  • Print_ISBN
    978-1-4244-5642-0
  • Electronic_ISBN
    978-1-4244-5643-7
  • Type

    conf

  • DOI
    10.1109/ICCMS.2010.63
  • Filename
    5421095